Semiconductor Burn-In Test Systems

EADS North America Test and Services is a leader in designing and building large parallel burn-in test systems for the semiconductor industry. Included with all systems is the ActivATE™ Test Platform. Designed for parallel test systems, the ActivATE software supports independent slot-level test, digital and JTAG testing, SECS/GEM control, individual or aggregate DUT temperature control, and independent test data streams. Features include:

Full DUT safeguards including max temperature, max current, max voltage, voltage fold-back, and auto-shutdown Per-DUT parameter sampling and logging down to 500mS intervals Up to 576 DUTs User accounts with user-level security control and access Extensive use of XML formats including recipe files, configuration files, test program files, and data collection
	Standard Microsoft look-and-feel Extensible, open-architecture framework. Microsoft Visual Studio templates for user-defined add-in modules. Manual or automatic DUT loading

The ActivATE software allows for test program development and verification while long-term burn-in testing is being conducted. The graphical user interface gives the test engineer full access to the hardware at all times.

Independent test monitoring and control